ISPE Glossary of Pharmaceutical and Biotechnology Terminology

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SEM (Scanning Electron Microscopy)

Utilizes an electron beam to produce images over a very broad magnification range of 10X to 105X. The technique is somewhat limited by the conductivity of the material but works very well to inspect 316L stainless steel. Typical magnification levels for surface defect evaluation are from 100 to 4,000.

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