Tamara Byrne is an application manager for MKS Umetrics in San Jose, CA. She manages an international team of application engineers supporting customers who use Umetrics' software SIMCA, MODDE, and SIMCA-online. She teaches advanced multivariate data analysis and data mining concepts including PCA, PLS, and batch analysis to a variety of industries including pharmaceutical, biotech, chemical, food, and semiconductor. She works with customers to analyze research data, optimize processes, and monitor manufacturing data in real-time. Previously, she built run to run algorithms and hundreds of multivariate fault detection models at IBM's 300mm semiconductor chip making facility before joining Umetrics in 2008.